Onto announces new eb40 all-surface inspection module for wafer fabs and advanced packaging

Wilmington, mass.--(business wire)---- $onto #backsideinspection--onto innovation inc. (nyse: onto) (“onto innovation,” “onto,” or the “company”) today announced its first shipment of the company's dragonfly® g3 system with the new eb40™ module to a top three semiconductor manufacturer. together, the system and module offer all-surface wafer inspection to address the yield loss caused by defects on the wafer edge and backside across front-end and back-end processes. all-surface inspection is becoming critical for quality as
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