Onto innovation announces third customer has qualified the atlas® v system for gate-all-around development and pilot production

Wilmington, mass.--(business wire)---- $onto #gaa--onto innovation inc. (nyse: onto) (“onto innovation,” “onto,” or the “company”) today announced it has received repeat orders of its atlas® v optical critical dimension (ocd) platform for its uniquely powerful metrology solution for gate-all-around (gaa) / nanosheet transistors, the next-generation device architecture for advanced logic. “the gaa device is extremely challenging for dimensional metrology. the device structure is significantly more complex than
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