Nova introduces revolutionary inline sims solution

Rehovot, israel, dec. 8, 2021 /prnewswire/ -- nova (nasdaq: nvmi) announced today the launch of nova metrion ® , the latest addition to its materials metrology portfolio, targeting  the process control of 3d logic and memory semiconductor devices. the newly introduced technology enables advanced materials profile measurements by bringing secondary ion mass spectrometry (sims) into semiconductor production lines.
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