Aehr announces new advanced testing capabilities on its fox-p™ wafer level test & burn-in systems for silicon carbide and gallium nitride technologies

Fremont, calif., oct. 06, 2022 (globe newswire) -- aehr test systems (nasdaq: aehr), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released two new enhancements for its fox-p family of wafer level test and burn-in systems. these include the fox™ bipolar voltage channel module (bvcm) and very high voltage channel module (vhvcm) options which enable new advanced test and burn-in capabilities for silicon-carbide and gallium-nitride power semiconductors on aehr's fox-p wafer-level test and burn-in systems. silicon carbide power devices and modules are being widely adopted in the drive train used in electric vehicles as well as onboard and offboard electric vehicle chargers. gallium nitride based semiconductors are at the early stages of their application usage, but are expected to grow significantly in their use in a wide range of power conversion applications including photovoltaic, industrial, and other electrification infrastructure applications. the new advanced wafer level test and burn-in capabilities enabled with the addition of the fox-p bvcm and vhvcm options allow silicon carbide and gallium nitride semiconductor manufacturers more flexibility to address a wider variety of stress and burn-in conditions to address their engineering qualification and production needs in fox-p multi-wafer test and burn-in systems. these options are available with new system shipments or for upgrades of previously shipped fox-p systems with first shipments planned with typical 12 - 16 week lead times.
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