Aehr test systems to present at ld micro main event conference on october 12 and discuss expanding silicon carbide test market opportunity for electric vehicles and electrification infrastructure

Fremont, calif., oct. 06, 2021 (globe newswire) -- aehr test systems (nasdaq: aehr), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that ceo and president gayn erickson will be presenting at the 14th annual ld micro main event conference on tuesday, october 12, 2021 at 3:30 pm pt at the luxe sunset bel-air in los angeles, and will be meeting with investors throughout the day. register to watch the virtual presentation here.
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