Aehr to showcase fox-p™ wafer-level, die and module test solutions at virtual swtest untethered 2020 conference on november 11

Fremont, calif., nov. 09, 2020 (globe newswire) -- aehr test systems (nasdaq: aehr), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its fox-p™ platform for multi-wafer, die and module test and burn-in systems for high volume production at the virtual swtest (semiconductor wafer test) untethered 2020 conference and expo on november 11, 2020.
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